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1 Ergebnisse
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Fabrication and Characterization of Stacked Poly-Si Nanoshe..:
Tsai, Meng-Ju
;
Peng, Kang-Hui
;
Sun, Chong-Jhe
...
IEEE Journal of the Electron Devices Society. 7 (2019) - p. 1133-1139 , 2019
Link:
https://doi.org/10.1109/jeds.2019.2952150
RT Journal T1 <Title>Fabrication and Characterization of Stacked Poly-Si Nanosheet With Gate-All-Around and Multi-Gate Junctionless Field Effect Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2019.2952150&Exemplar=1&LAN=DE A1 Tsai, Meng-Ju A1 Peng, Kang-Hui A1 Sun, Chong-Jhe A1 Yan, Siao-Cheng A1 Hsu, Chieng-Chung A1 Lin, Yu-Ru A1 Lin, Yu-Hsien A1 Wu, Yung-Chun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2019 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 7 SP 1133 OP 1139 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2019.2952150 DO https://doi.org/10.1109/jeds.2019.2952150 SF ELIB - SuUB Bremen
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