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Novel Driving Methods of Gate Driver for Enhancement- and D..:
Oh, Jongsu
;
Jung, Kyung-Mo
;
Jung, Eun Kyo
...
IEEE Journal of the Electron Devices Society. 8 (2020) - p. 67-73 , 2020
Link:
https://doi.org/10.1109/jeds.2019.2963431
RT Journal T1
Novel Driving Methods of Gate Driver for Enhancement- and Depletion-Mode Oxide TFTs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2019.2963431&Exemplar=1&LAN=DE A1 Oh, Jongsu A1 Jung, Kyung-Mo A1 Jung, Eun Kyo A1 Lee, Jungwoo A1 Lee, Soo-Yeon A1 Park, Keechan A1 Jeon, Jae-Hong A1 Kim, Yong-Sang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2020 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 8 SP 67 OP 73 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2019.2963431 DO https://doi.org/10.1109/jeds.2019.2963431 SF ELIB - SuUB Bremen
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