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1 Ergebnisse
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Impact of Sulfur Passivation on Carrier Transport Propertie..:
Kim, Jun-Gyu
;
Jo, Hyeon-Bhin
;
Lee, In-Geun
..
IEEE Journal of the Electron Devices Society. 9 (2021) - p. 209-214 , 2021
Link:
https://doi.org/10.1109/jeds.2021.3056689
RT Journal T1 <Title>Impact of Sulfur Passivation on Carrier Transport Properties of In0.7Ga0.3As Quantum-Well MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2021.3056689&Exemplar=1&LAN=DE A1 Kim, Jun-Gyu A1 Jo, Hyeon-Bhin A1 Lee, In-Geun A1 Kim, Tae-Woo A1 Kim, Dae-Hyun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 9 SP 209 OP 214 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2021.3056689 DO https://doi.org/10.1109/jeds.2021.3056689 SF ELIB - SuUB Bremen
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