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Research on ESD Protection of Ultra-High Voltage nLDMOS Dev..:

Lan, Tien-Yu ; Chen, Shen-Li ; Chen, Hung-Wei.
IEEE Journal of the Electron Devices Society.  9 (2021)  - p. 763-773 , 2021
Link: https://doi.org/10.1109/jeds.2021.3102278