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1 Ergebnisse
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Enhancement-Mode Characteristics of Al₀.₆₅Ga₀.₃₅N/Al₀.₃Ga₀...:
Lee, Ching-Sung
;
Li, Chia-Lun
;
Hsu, Wei-Chou
..
IEEE Journal of the Electron Devices Society. 9 (2021) - p. 1003-1008 , 2021
Link:
https://doi.org/10.1109/jeds.2021.3121441
RT Journal T1
Enhancement-Mode Characteristics of Al₀.₆₅Ga₀.₃₅N/Al₀.₃Ga₀.₇N/AlN/SiC MOS-HFETs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2021.3121441&Exemplar=1&LAN=DE A1 Lee, Ching-Sung A1 Li, Chia-Lun A1 Hsu, Wei-Chou A1 You, Cheng-Yang A1 Liu, Han-Yin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 9 SP 1003 OP 1008 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2021.3121441 DO https://doi.org/10.1109/jeds.2021.3121441 SF ELIB - SuUB Bremen
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