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Impacts of Pulsing Schemes on the Endurance of Ferroelectri..:
Wu, Cheng-Hung
;
Ronchi, Nicolo'
;
Wang, Kuan-Chi
...
IEEE Journal of the Electron Devices Society. 10 (2022) - p. 109-114 , 2022
Link:
https://doi.org/10.1109/jeds.2022.3141756
RT Journal T1
Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal–Ferroelectric–Insulator–Semiconductor Capacitors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2022.3141756&Exemplar=1&LAN=DE A1 Wu, Cheng-Hung A1 Ronchi, Nicolo' A1 Wang, Kuan-Chi A1 Wang, Yu-Yun A1 Mcmitchell, Sean A1 Banerjee, Kaustuv A1 van Den Bosch, Geert A1 van Houdt, Jan A1 Wu, Tian-Li PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 10 SP 109 OP 114 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2022.3141756 DO https://doi.org/10.1109/jeds.2022.3141756 SF ELIB - SuUB Bremen
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