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1 Ergebnisse
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BEOL Process Effects on ePCM Reliability:
Redaelli, A.
;
Gandolfo, A.
;
Samanni, G.
...
IEEE Journal of the Electron Devices Society. 10 (2022) - p. 563-568 , 2022
Link:
https://doi.org/10.1109/jeds.2022.3162755
RT Journal T1 <Title>BEOL Process Effects on ePCM Reliability</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2022.3162755&Exemplar=1&LAN=DE A1 Redaelli, A. A1 Gandolfo, A. A1 Samanni, G. A1 Gomiero, E. A1 Petroni, E. A1 Scotti, L. A1 Lippiello, A. A1 Mattavelli, P. A1 Jasse, J. A1 Codegoni, D. A1 Serafini, A. A1 Ranica, R. A1 Boccaccio, C. A1 Sandrini, J. A1 Berthelon, R. A1 Grenier, J.-C. A1 Weber, O. A1 Turgis, D. A1 Valery, A. A1 Medico, S. Del A1 Caubet, V. A1 Reynard, J.-P. A1 Dutartre, D. A1 Favennec, L. A1 Conte, A. A1 Disegni, F. A1 De Tomasi, M. A1 Ventre, A. A1 Baldo, M. A1 Ielmini, D. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 10 SP 563 OP 568 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2022.3162755 DO https://doi.org/10.1109/jeds.2022.3162755 SF ELIB - SuUB Bremen
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