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Reliability Study of 1T1C FeRAM Arrays With Hf0.5Zr0.5O₂ Th..:
Okuno, Jun
;
Kunihiro, Takafumi
;
Konishi, Kenta
...
IEEE Journal of the Electron Devices Society. 10 (2022) - p. 778-783 , 2022
Link:
https://doi.org/10.1109/jeds.2022.3187101
RT Journal T1 <Title>Reliability Study of 1T1C FeRAM Arrays With Hf0.5Zr0.5O₂ Thickness Scaling</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2022.3187101&Exemplar=1&LAN=DE A1 Okuno, Jun A1 Kunihiro, Takafumi A1 Konishi, Kenta A1 Shuto, Yusuke A1 Sugaya, Fumitaka A1 Materano, Monica A1 Ali, Tarek A1 Lederer, Maximilian A1 Kuehnel, Kati A1 Seidel, Konrad A1 Mikolajick, Thomas A1 Schroeder, Uwe A1 Tsukamoto, Masanori A1 Umebayashi, Taku PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 10 SP 778 OP 783 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2022.3187101 DO https://doi.org/10.1109/jeds.2022.3187101 SF ELIB - SuUB Bremen
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