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O2 and H2O Barrier-Based High Reliability and Stability Usi..:

Shan, Fei ; Zhao, Han-Lin ; Wang, Xiao-Lin..
IEEE Journal of the Electron Devices Society.  10 (2022)  - p. 642-648 , 2022
Link: https://doi.org/10.1109/jeds.2022.3194864