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1 Ergebnisse
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Investigation of CDM ESD Protection Capability Among Power-..:
Huang, Yi-Chun
;
Ker, Ming-Dou
IEEE Journal of the Electron Devices Society. 11 (2023) - p. 84-94 , 2023
Link:
https://doi.org/10.1109/jeds.2022.3228859
RT Journal T1 <Title>Investigation of CDM ESD Protection Capability Among Power-Rail ESD Clamp Circuits in CMOS ICs With Decoupling Capacitors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2022.3228859&Exemplar=1&LAN=DE A1 Huang, Yi-Chun A1 Ker, Ming-Dou PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 11 SP 84 OP 94 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2022.3228859 DO https://doi.org/10.1109/jeds.2022.3228859 SF ELIB - SuUB Bremen
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