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1 Ergebnisse
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New Insights Into Noise Characteristics of Hot Carrier Indu..:
Zhu, Kunfeng
;
Zhang, Peijian
;
Xu, Zicheng
...
IEEE Journal of the Electron Devices Society. 11 (2023) - p. 30-35 , 2023
Link:
https://doi.org/10.1109/jeds.2023.3239341
RT Journal T1 <Title>New Insights Into Noise Characteristics of Hot Carrier Induced Defects in Polysilicon Emitter Bipolar Junction Transistors and SiGe HBTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2023.3239341&Exemplar=1&LAN=DE A1 Zhu, Kunfeng A1 Zhang, Peijian A1 Xu, Zicheng A1 Wang, Tao A1 Yi, Xiaohui A1 Hong, Min A1 Yang, Yonghui A1 Zhang, Guangsheng A1 Liu, Jian A1 Wei, Jianan A1 Pu, Yang A1 Huang, Dong A1 Luo, Ting A1 Chen, Xian A1 Tang, Xinyue A1 Tan, Kaizhou A1 Chen, Wensuo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 11 SP 30 OP 35 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2023.3239341 DO https://doi.org/10.1109/jeds.2023.3239341 SF ELIB - SuUB Bremen
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