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Compensation of Hot Carrier Degradation Enabled by Forward ..:
Qian, Yijun
;
Liu, Qiang
;
Yao, Jialun
...
IEEE Journal of the Electron Devices Society. 11 (2023) - p. 319-324 , 2023
Link:
https://doi.org/10.1109/jeds.2023.3278936
RT Journal T1 <Title>Compensation of Hot Carrier Degradation Enabled by Forward Back Bias in π-GAA-π MOSFET</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2023.3278936&Exemplar=1&LAN=DE A1 Qian, Yijun A1 Liu, Qiang A1 Yao, Jialun A1 Wang, Xiaowei A1 Shukla, Amit Kumar A1 Liu, Fengyu A1 Wu, Tao A1 Lu, Kai A1 Dong, Yemin A1 Wei, Xing A1 Yu, Wenjie A1 Mu, Zhiqiang A1 Yang, Yumeng PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 11 SP 319 OP 324 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2023.3278936 DO https://doi.org/10.1109/jeds.2023.3278936 SF ELIB - SuUB Bremen
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