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1 Ergebnisse
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Wafer-Level Characterization and Monitoring Platform for Si..:
Parent, Samuel
;
Vachon, Frédéric
;
Gauthier, Valérie
...
IEEE Journal of the Electron Devices Society. 12 (2024) - p. 127-137 , 2024
Link:
https://doi.org/10.1109/jeds.2024.3359088
RT Journal T1
Wafer-Level Characterization and Monitoring Platform for Single-Photon Avalanche Diodes
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2024.3359088&Exemplar=1&LAN=DE A1 Parent, Samuel A1 Vachon, Frédéric A1 Gauthier, Valérie A1 Lamoureux, Steve A1 Paquette, Alexandre A1 Deschamps, Jacob A1 Rossignol, Tommy A1 Roy, Nicolas A1 Arsenault, Philippe A1 Dautet, Henri A1 Charlebois, Serge A. A1 Pratte, Jean-François PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 12 SP 127 OP 137 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2024.3359088 DO https://doi.org/10.1109/jeds.2024.3359088 SF ELIB - SuUB Bremen
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