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1 Ergebnisse
1
Investigation of Electrical Property and Thermal Stability ..:
Qin, Jian
;
Chen, Jingxiong
;
Xiao, Wenxuan
.
IEEE Journal of the Electron Devices Society. 12 (2024) - p. 104-112 , 2024
Link:
https://doi.org/10.1109/jeds.2024.3360244
RT Journal T1 <Title>Investigation of Electrical Property and Thermal Stability in Enhancement-Mode InxAl1–xN/AlN/GaN MOS-HEMTs Fabricated by Using NiOx Gate and Fluorine Treatment</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2024.3360244&Exemplar=1&LAN=DE A1 Qin, Jian A1 Chen, Jingxiong A1 Xiao, Wenxuan A1 Wang, Hong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 12 SP 104 OP 112 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2024.3360244 DO https://doi.org/10.1109/jeds.2024.3360244 SF ELIB - SuUB Bremen
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