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1 Ergebnisse
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An Improved Method for InP HEMT Noise-Parameter Determinati..:
Lyu, Yuanting
;
Li, Zhichun
;
Zhang, Ao
.
IEEE Journal of the Electron Devices Society. 12 (2024) - p. 113-120 , 2024
Link:
https://doi.org/10.1109/jeds.2024.3360461
RT Journal T1 <Title>An Improved Method for InP HEMT Noise-Parameter Determination Based on 50-Ω Noise Measurements</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2024.3360461&Exemplar=1&LAN=DE A1 Lyu, Yuanting A1 Li, Zhichun A1 Zhang, Ao A1 Gao, Jianjun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 12 SP 113 OP 120 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2024.3360461 DO https://doi.org/10.1109/jeds.2024.3360461 SF ELIB - SuUB Bremen
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