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1 Ergebnisse
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Mechanism of Threshold Voltage Instability in Double Gate α..:
Aslam, Muhammad
;
Chang, Shu-Wei
;
Chen, Yi-Ho
...
IEEE Journal of the Electron Devices Society. 12 (2024) - p. 464-471 , 2024
Link:
https://doi.org/10.1109/jeds.2024.3406676
RT Journal T1 <Title>Mechanism of Threshold Voltage Instability in Double Gate α-IGZO Nanosheet TFT Under Bias and Temperature Stress</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2024.3406676&Exemplar=1&LAN=DE A1 Aslam, Muhammad A1 Chang, Shu-Wei A1 Chen, Yi-Ho A1 Lee, Yao-Jen A1 Li, Yiming A1 Lee, Wen-Hsi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 12 SP 464 OP 471 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2024.3406676 DO https://doi.org/10.1109/jeds.2024.3406676 SF ELIB - SuUB Bremen
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