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1 Ergebnisse
1
A High-Performance and Low HCI Degradation LDMOS Device Wit..:
Yu, Shaoxin
;
Chen, Rongsheng
;
Shao, Weiheng
...
IEEE Journal of the Electron Devices Society. 12 (2024) - p. 605-612 , 2024
Link:
https://doi.org/10.1109/jeds.2024.3433442
RT Journal T1
A High-Performance and Low HCI Degradation LDMOS Device With a Hybrid Field Plate
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jeds.2024.3433442&Exemplar=1&LAN=DE A1 Yu, Shaoxin A1 Chen, Rongsheng A1 Shao, Weiheng A1 Yu, Weiming A1 Zhao, Xiaoyan A1 Chen, Zheng A1 Shan, Weizhong A1 Cheng, Jenhao PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2168-6734 JF IEEE Journal of the Electron Devices Society VO 12 SP 605 OP 612 LK http://dx.doi.org/https://doi.org/10.1109/jeds.2024.3433442 DO https://doi.org/10.1109/jeds.2024.3433442 SF ELIB - SuUB Bremen
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