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Analysis of Current Transport Layer Localized Resistivity I..:
Trivellin, Nicola
;
Buffolo, Matteo
;
De Santi, Carlo
...
IEEE Journal of Emerging and Selected Topics in Industrial Electronics. 4 (2023) 1 - p. 309-316 , 2023
Link:
https://doi.org/10.1109/jestie.2022.3212331
RT Journal T1 <Title>Analysis of Current Transport Layer Localized Resistivity Increase After High Stress on InGaN LEDs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jestie.2022.3212331&Exemplar=1&LAN=DE A1 Trivellin, Nicola A1 Buffolo, Matteo A1 De Santi, Carlo A1 Zanoni, Enrico A1 Meneghesso, Gaudenzio A1 Meneghini, Matteo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2687-9735 SN 2687-9743 JF IEEE Journal of Emerging and Selected Topics in Industrial Electronics VO 4 IS 1 SP 309 OP 316 LK http://dx.doi.org/https://doi.org/10.1109/jestie.2022.3212331 DO https://doi.org/10.1109/jestie.2022.3212331 SF ELIB - SuUB Bremen
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