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1 Ergebnisse
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Digital-Twin-Compatible Optimization of Switching Character..:
Takayama, Hajime
;
Fukunaga, Shuhei
;
Hikihara, Takashi
IEEE Journal of Emerging and Selected Topics in Industrial Electronics. 4 (2023) 4 - p. 1024-1033 , 2023
Link:
https://doi.org/10.1109/jestie.2023.3291636
RT Journal T1 <Title>Digital-Twin-Compatible Optimization of Switching Characteristics for SiC MOSFETs Using Genetic Algorithm</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jestie.2023.3291636&Exemplar=1&LAN=DE A1 Takayama, Hajime A1 Fukunaga, Shuhei A1 Hikihara, Takashi PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 2687-9735 SN 2687-9743 JF IEEE Journal of Emerging and Selected Topics in Industrial Electronics VO 4 IS 4 SP 1024 OP 1033 LK http://dx.doi.org/https://doi.org/10.1109/jestie.2023.3291636 DO https://doi.org/10.1109/jestie.2023.3291636 SF ELIB - SuUB Bremen
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