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A Probabilistic Approach to Series Arc Fault Detection and ..:

Gajula, Kaushik ; Le, Vu ; Yao, Xiu..
IEEE Journal of Emerging and Selected Topics in Industrial Electronics.  5 (2024)  1 - p. 27-38 , 2024
Link: https://doi.org/10.1109/jestie.2023.3331183