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1 Ergebnisse
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Knowledge and Data Dual-Driven Fault Diagnosis in Industria..:
Wang, Yimeng
;
Shen, Jie
;
Yang, Shusen
...
IEEE Internet of Things Journal. 11 (2024) 11 - p. 19256-19277 , 2024
Link:
https://doi.org/10.1109/jiot.2024.3387538
RT Journal T1 <Title>Knowledge and Data Dual-Driven Fault Diagnosis in Industrial Scenarios: A Survey</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jiot.2024.3387538&Exemplar=1&LAN=DE A1 Wang, Yimeng A1 Shen, Jie A1 Yang, Shusen A1 Han, Qing A1 Zhao, Cong A1 Zhao, Peng A1 Ren, Xuebin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 2327-4662 SN 2372-2541 JF IEEE Internet of Things Journal VO 11 IS 11 SP 19256 OP 19277 LK http://dx.doi.org/https://doi.org/10.1109/jiot.2024.3387538 DO https://doi.org/10.1109/jiot.2024.3387538 SF ELIB - SuUB Bremen
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