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1 Ergebnisse
1
Shock Destructive Reliability Analysis of Electromagnetic M..:
Fang, Xiao-Yong
;
Hu, Kai-Ming
;
Yan, Ge
...
Journal of Microelectromechanical Systems. 31 (2022) 1 - p. 134-142 , 2022
Link:
https://doi.org/10.1109/jmems.2021.3130001
RT Journal T1 <Title>Shock Destructive Reliability Analysis of Electromagnetic MEMS Micromirror for Automotive LiDAR</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jmems.2021.3130001&Exemplar=1&LAN=DE A1 Fang, Xiao-Yong A1 Hu, Kai-Ming A1 Yan, Ge A1 Wu, Zhi-Yuan A1 Wu, Jia-Hao A1 Zhang, Wen-Ming PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1057-7157 SN 1941-0158 JF Journal of Microelectromechanical Systems VO 31 IS 1 SP 134 OP 142 LK http://dx.doi.org/https://doi.org/10.1109/jmems.2021.3130001 DO https://doi.org/10.1109/jmems.2021.3130001 SF ELIB - SuUB Bremen
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