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Understanding the Optical Degradation of 845 nm Micro-Trans..:
Zenari, Michele
;
Buffolo, Matteo
;
Fornasier, Mirko
...
IEEE Journal of Quantum Electronics. 59 (2023) 4 - p. 1-10 , 2023
Link:
https://doi.org/10.1109/jqe.2023.3283514
RT Journal T1
Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jqe.2023.3283514&Exemplar=1&LAN=DE A1 Zenari, Michele A1 Buffolo, Matteo A1 Fornasier, Mirko A1 De Santi, Carlo A1 Goyvaerts, Jeroen A1 Grabowski, Alexander A1 Gustavsson, Johan A1 Kumari, Sulakshna A1 Stassren, Andim A1 Baets, Roel A1 Larsson, Anders A1 Roelkens, Günther A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Meneghini, Matteo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9197 SN 1558-1713 JF IEEE Journal of Quantum Electronics VO 59 IS 4 SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/jqe.2023.3283514 DO https://doi.org/10.1109/jqe.2023.3283514 SF ELIB - SuUB Bremen
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