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Reliability analysis of extended generalized inverted expon..:
Alshangiti, Arwa M.
;
Kayid, M.
;
Almulhim, M.
Journal of Systems Engineering and Electronics. 27 (2016) 2 - p. 484-492 , 2016
Link:
https://doi.org/10.1109/jsee.2016.00051
RT Journal T1 <Title>Reliability analysis of extended generalized inverted exponential distribution with applications</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jsee.2016.00051&Exemplar=1&LAN=DE A1 Alshangiti, Arwa M. A1 Kayid, M. A1 Almulhim, M. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2016 SN 1004-4132 JF Journal of Systems Engineering and Electronics VO 27 IS 2 SP 484 OP 492 LK http://dx.doi.org/https://doi.org/10.1109/jsee.2016.00051 DO https://doi.org/10.1109/jsee.2016.00051 SF ELIB - SuUB Bremen
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