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1 Ergebnisse
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Failure Mechanism Analysis and Experiment of MEMS VRG Under..:
Wang, Jin
;
Cai, Qi
;
Wei, Wenqiang
...
IEEE Sensors Journal. 24 (2024) 11 - p. 17507-17519 , 2024
Link:
https://doi.org/10.1109/jsen.2024.3389744
RT Journal T1
Failure Mechanism Analysis and Experiment of MEMS VRG Under High-g Shock
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jsen.2024.3389744&Exemplar=1&LAN=DE A1 Wang, Jin A1 Cai, Qi A1 Wei, Wenqiang A1 Cui, Rang A1 Shi, Yunbo A1 Shen, Chong A1 Cao, Huiliang PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1530-437X SN 1558-1748 SN 2379-9153 JF IEEE Sensors Journal VO 24 IS 11 SP 17507 OP 17519 LK http://dx.doi.org/https://doi.org/10.1109/jsen.2024.3389744 DO https://doi.org/10.1109/jsen.2024.3389744 SF ELIB - SuUB Bremen
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