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1 Ergebnisse
1
A 22-nm 1-Mb 1024-b Read Data-Protected STT-MRAM Macro With..:
Chiu, Yen-Cheng
;
Chang, Tung-Cheng
;
Lee, Chun-Ying
...
IEEE Journal of Solid-State Circuits. 57 (2022) 6 - p. 1936-1949 , 2022
Link:
https://doi.org/10.1109/jssc.2021.3112182
RT Journal T1
A 22-nm 1-Mb 1024-b Read Data-Protected STT-MRAM Macro With Near-Memory Shift-and-Rotate Functionality and 42.6-GB/s Read Bandwidth for Security-Aware Mobile Device
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jssc.2021.3112182&Exemplar=1&LAN=DE A1 Chiu, Yen-Cheng A1 Chang, Tung-Cheng A1 Lee, Chun-Ying A1 Hung, Je-Min A1 Chang, Kuang-Tang A1 Xue, Cheng-Xin A1 Wu, Ssu-Yen A1 Kao, Hui-Yao A1 Chen, Peng A1 Huang, Hsiao-Yu A1 Teng, Shih-Hsih A1 Lo, Chieh-Pu A1 Shih, Yi-Chun A1 Chih, Yu-Der A1 Chang, Tsung-Yung Jonathan A1 Jin, Yier A1 Chang, Meng-Fan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9200 SN 1558-173X JF IEEE Journal of Solid-State Circuits VO 57 IS 6 SP 1936 OP 1949 LK http://dx.doi.org/https://doi.org/10.1109/jssc.2021.3112182 DO https://doi.org/10.1109/jssc.2021.3112182 SF ELIB - SuUB Bremen
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