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1 Ergebnisse
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A 3-nm Gate-All-Around SRAM Featuring an Adaptive Dual-Bitl..:
Song, Taejoong
;
Kim, Hoonki
;
Rim, Woojin
...
IEEE Journal of Solid-State Circuits. 57 (2022) 1 - p. 236-244 , 2022
Link:
https://doi.org/10.1109/jssc.2021.3123077
RT Journal T1
A 3-nm Gate-All-Around SRAM Featuring an Adaptive Dual-Bitline and an Adaptive Cell-Power Assist Circuit
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jssc.2021.3123077&Exemplar=1&LAN=DE A1 Song, Taejoong A1 Kim, Hoonki A1 Rim, Woojin A1 Jung, Hakchul A1 Park, Changnam A1 Lee, Inhak A1 Baek, Sanghoon A1 Jung, Jonghoon PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9200 SN 1558-173X JF IEEE Journal of Solid-State Circuits VO 57 IS 1 SP 236 OP 244 LK http://dx.doi.org/https://doi.org/10.1109/jssc.2021.3123077 DO https://doi.org/10.1109/jssc.2021.3123077 SF ELIB - SuUB Bremen
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