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1 Ergebnisse
1
A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRA..:
Yoon, Jong-Hyeok
;
Chang, Muya
;
Khwa, Win-San
...
IEEE Journal of Solid-State Circuits. 57 (2022) 3 - p. 845-857 , 2022
Link:
https://doi.org/10.1109/jssc.2022.3141370
RT Journal T1
A 40-nm 118.44-TOPS/W Voltage-Sensing Compute-in-Memory RRAM Macro With Write Verification and Multi-Bit Encoding
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jssc.2022.3141370&Exemplar=1&LAN=DE A1 Yoon, Jong-Hyeok A1 Chang, Muya A1 Khwa, Win-San A1 Chih, Yu-Der A1 Chang, Meng-Fan A1 Raychowdhury, Arijit PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0018-9200 SN 1558-173X JF IEEE Journal of Solid-State Circuits VO 57 IS 3 SP 845 OP 857 LK http://dx.doi.org/https://doi.org/10.1109/jssc.2022.3141370 DO https://doi.org/10.1109/jssc.2022.3141370 SF ELIB - SuUB Bremen
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