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1 Ergebnisse
1
A 1-Tb 4-b/cell 4-Plane 162-Layer 3-D Flash Memory With 2.4..:
Yuh, Jong Hak
;
Li, Yen-Lung Jason
;
Li, Heguang
...
IEEE Journal of Solid-State Circuits. 58 (2023) 1 - p. 316-328 , 2023
Link:
https://doi.org/10.1109/jssc.2022.3193326
RT Journal T1
A 1-Tb 4-b/cell 4-Plane 162-Layer 3-D Flash Memory With 2.4-Gb/s IO Interface
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jssc.2022.3193326&Exemplar=1&LAN=DE A1 Yuh, Jong Hak A1 Li, Yen-Lung Jason A1 Li, Heguang A1 Oyama, Yoshihiro A1 Hsu, Cynthia A1 Anantula, Pradeep A1 Jeong, Gwang Yeong Stanley A1 Amarnath, Anirudh A1 Darne, Siddhesh A1 Bhatia, Sneha A1 Tang, Tianyu A1 Arya, Aditya A1 Rastogi, Naman A1 Ookuma, Naoki A1 Mizukoshi, Hiroyuki A1 Yap, Alex A1 Wang, Demin A1 Kim, Steve A1 Wu, Yonggang A1 Peng, Min A1 Lu, Jason A1 Ip, Tommy A1 Malhotra, Seema A1 Han, Taekeun A1 Okumura, Masatoshi A1 Liu, Jiwen A1 Sohn, Jeongduk John A1 Chibvongodze, Hardwell A1 Balaga, Muralikrishna A1 Matsuda, Akihiro PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9200 SN 1558-173X JF IEEE Journal of Solid-State Circuits VO 58 IS 1 SP 316 OP 328 LK http://dx.doi.org/https://doi.org/10.1109/jssc.2022.3193326 DO https://doi.org/10.1109/jssc.2022.3193326 SF ELIB - SuUB Bremen
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