I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
A Three-Wafer-Stacked Hybrid 15-MPixel CIS + 1-MPixel EVS W..:
Guo, Menghan
;
Chen, Shoushun
;
Gao, Zhe
...
IEEE Journal of Solid-State Circuits. 58 (2023) 11 - p. 2955-2964 , 2023
Link:
https://doi.org/10.1109/jssc.2023.3303154
RT Journal T1
A Three-Wafer-Stacked Hybrid 15-MPixel CIS + 1-MPixel EVS With 4.6-GEvent/s Readout, In-Pixel TDC, and On-Chip ISP and ESP Function
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jssc.2023.3303154&Exemplar=1&LAN=DE A1 Guo, Menghan A1 Chen, Shoushun A1 Gao, Zhe A1 Yang, Wenlei A1 Bartkovjak, Peter A1 Qin, Qing A1 Hu, Xiaoqin A1 Zhou, Dahai A1 Huang, Qiping A1 Uchiyama, Masayuki A1 Kudo, Yoshiharu A1 Fukuoka, Shimpei A1 Xu, Chengcheng A1 Ebihara, Hiroaki A1 Wang, Xueqing A1 Jiang, Peiwen A1 Jiang, Bo A1 Mu, Bo A1 Chen, Huan A1 Yang, Jason A1 Dai, T. J. A1 Suess, Andreas PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0018-9200 SN 1558-173X JF IEEE Journal of Solid-State Circuits VO 58 IS 11 SP 2955 OP 2964 LK http://dx.doi.org/https://doi.org/10.1109/jssc.2023.3303154 DO https://doi.org/10.1109/jssc.2023.3303154 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)