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1 Ergebnisse
1
Smart Write Algorithm to Enhance Performances and Reliabili..:
Giraud, Bastien
;
Ricavy, Sebastien
;
Laffond, Cyrille
...
IEEE Journal of Solid-State Circuits. , 2024
Link:
https://doi.org/10.1109/jssc.2024.3386429
RT Journal T1
Smart Write Algorithm to Enhance Performances and Reliability of an RRAM Macro
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jssc.2024.3386429&Exemplar=1&LAN=DE A1 Giraud, Bastien A1 Ricavy, Sebastien A1 Laffond, Cyrille A1 Sever, Ilan A1 Gherman, Valentin A1 Lepin, Florent A1 Diallo, Mariam A1 Zenati, Khadija A1 Dumas, Sylvain A1 Guille, Olivier A1 Vershkov, Maxim A1 Bricalli, Alessandro A1 Piccolboni, Giuseppe A1 Noel, Jean-Philippe A1 Samir, Anass A1 Pillonnet, Gaël A1 Thonnart, Yvain A1 Molas, Gabriel PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0018-9200 SN 1558-173X JF IEEE Journal of Solid-State Circuits SP 1 OP 13 LK http://dx.doi.org/https://doi.org/10.1109/jssc.2024.3386429 DO https://doi.org/10.1109/jssc.2024.3386429 SF ELIB - SuUB Bremen
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