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1 Ergebnisse
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Field-Scale Precision: Predicting Grain Yield of Diverse Wh..:
Ali, Nisar
;
Mohammed, Ahmed
;
Bais, Abdul
...
IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing. 17 (2024) - p. 11419-11433 , 2024
Link:
https://doi.org/10.1109/jstars.2024.3411994
RT Journal T1 <Title>Field-Scale Precision: Predicting Grain Yield of Diverse Wheat Breeding Lines Using High-Throughput UAV Multispectral Imaging</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jstars.2024.3411994&Exemplar=1&LAN=DE A1 Ali, Nisar A1 Mohammed, Ahmed A1 Bais, Abdul A1 Berraies, Samia A1 Ruan, Yuefeng A1 Cuthbert, Richard D. A1 Sangha, Jatinder S. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1939-1404 SN 2151-1535 JF IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing VO 17 SP 11419 OP 11433 LK http://dx.doi.org/https://doi.org/10.1109/jstars.2024.3411994 DO https://doi.org/10.1109/jstars.2024.3411994 SF ELIB - SuUB Bremen
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