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1 Ergebnisse
1
Origin of the Diffusion-Related Optical Degradation of 1.3 ..:
Buffolo, Matteo
;
Lain, Federico
;
Zenari, M.
...
IEEE Journal of Selected Topics in Quantum Electronics. 28 (2022) 1: Semiconductor Lasers - p. 1-9 , 2022
Link:
https://doi.org/10.1109/jstqe.2021.3091960
RT Journal T1
Origin of the Diffusion-Related Optical Degradation of 1.3 μm Inas QD-LDs Epitaxially Grown on Silicon Substrate
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jstqe.2021.3091960&Exemplar=1&LAN=DE A1 Buffolo, Matteo A1 Lain, Federico A1 Zenari, M. A1 Santi, Carlo De A1 Norman, Justin A1 Bowers, John E. A1 Herrick, Robert W. A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Meneghini, Matteo PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1077-260X SN 1558-4542 JF IEEE Journal of Selected Topics in Quantum Electronics VO 28 IS 1: Semiconductor Lasers SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/jstqe.2021.3091960 DO https://doi.org/10.1109/jstqe.2021.3091960 SF ELIB - SuUB Bremen
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