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1 Ergebnisse
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Characterizing Ferroelectric Properties of Hf0.5Zr0.5O2 Fro..:
Hur, Jae
;
Luo, Yuan-Chun
;
Wang, Zheng
...
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits. 7 (2021) 2 - p. 168-174 , 2021
Link:
https://doi.org/10.1109/jxcdc.2021.3130783
RT Journal T1 <Title>Characterizing Ferroelectric Properties of Hf0.5Zr0.5O2 From Deep-Cryogenic Temperature (4 K) to 400 K</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jxcdc.2021.3130783&Exemplar=1&LAN=DE A1 Hur, Jae A1 Luo, Yuan-Chun A1 Wang, Zheng A1 Lombardo, Sarah A1 Khan, Asif Islam A1 Yu, Shimeng PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2329-9231 JF IEEE Journal on Exploratory Solid-State Computational Devices and Circuits VO 7 IS 2 SP 168 OP 174 LK http://dx.doi.org/https://doi.org/10.1109/jxcdc.2021.3130783 DO https://doi.org/10.1109/jxcdc.2021.3130783 SF ELIB - SuUB Bremen
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