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1 Ergebnisse
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Power Performance Analysis of Digital Standard Cells for 28..:
Saligram, Rakshith
;
Chakraborty, Wriddhi
;
Cao, Ningyuan
...
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits. 7 (2021) 2 - p. 193-200 , 2021
Link:
https://doi.org/10.1109/jxcdc.2021.3131100
RT Journal T1 <Title>Power Performance Analysis of Digital Standard Cells for 28 nm Bulk CMOS at Cryogenic Temperature Using BSIM Models</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jxcdc.2021.3131100&Exemplar=1&LAN=DE A1 Saligram, Rakshith A1 Chakraborty, Wriddhi A1 Cao, Ningyuan A1 Cao, Yu A1 Datta, Suman A1 Raychowdhury, Arijit PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2329-9231 JF IEEE Journal on Exploratory Solid-State Computational Devices and Circuits VO 7 IS 2 SP 193 OP 200 LK http://dx.doi.org/https://doi.org/10.1109/jxcdc.2021.3131100 DO https://doi.org/10.1109/jxcdc.2021.3131100 SF ELIB - SuUB Bremen
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