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1 Ergebnisse
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Characterization and Modeling of 22 nm FDSOI Cryogenic RF C..:
Chakraborty, Wriddhi
;
Aabrar, Khandker Akif
;
Gomez, Jorge
...
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits. 7 (2021) 2 - p. 184-192 , 2021
Link:
https://doi.org/10.1109/jxcdc.2021.3131144
RT Journal T1
Characterization and Modeling of 22 nm FDSOI Cryogenic RF CMOS
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_jxcdc.2021.3131144&Exemplar=1&LAN=DE A1 Chakraborty, Wriddhi A1 Aabrar, Khandker Akif A1 Gomez, Jorge A1 Saligram, Rakshith A1 Raychowdhury, Arijit A1 Fay, Patrick A1 Datta, Suman PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 2329-9231 JF IEEE Journal on Exploratory Solid-State Computational Devices and Circuits VO 7 IS 2 SP 184 OP 192 LK http://dx.doi.org/https://doi.org/10.1109/jxcdc.2021.3131144 DO https://doi.org/10.1109/jxcdc.2021.3131144 SF ELIB - SuUB Bremen
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