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1 Ergebnisse
1
Scale-Model Simulation:
Liu, Wenjie
;
Heirman, Wim
;
Eyerman, Stijn
..
IEEE Computer Architecture Letters. 20 (2021) 2 - p. 175-178 , 2021
Link:
https://doi.org/10.1109/lca.2021.3133112
RT Journal T1 <Title>Scale-Model Simulation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_lca.2021.3133112&Exemplar=1&LAN=DE A1 Liu, Wenjie A1 Heirman, Wim A1 Eyerman, Stijn A1 Akram, Shoaib A1 Eeckhout, Lieven PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 1556-6056 SN 1556-6064 SN 2473-2575 JF IEEE Computer Architecture Letters VO 20 IS 2 SP 175 OP 178 LK http://dx.doi.org/https://doi.org/10.1109/lca.2021.3133112 DO https://doi.org/10.1109/lca.2021.3133112 SF ELIB - SuUB Bremen
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