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1 Ergebnisse
1
Investigating the Back-Channel Effect and Asymmetric Degrad..:
Lin, Wei-Chen
;
Chang, Ting-Chang
;
Su, Wan-Ching
...
IEEE Electron Device Letters. 41 (2020) 1 - p. 58-61 , 2020
Link:
https://doi.org/10.1109/led.2019.2952583
RT Journal T1
Investigating the Back-Channel Effect and Asymmetric Degradation Under Self-Heating Stress in Large Size a-InGaZnO TFTs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2019.2952583&Exemplar=1&LAN=DE A1 Lin, Wei-Chen A1 Chang, Ting-Chang A1 Su, Wan-Ching A1 Hung, Yang-Hau A1 Cheng, Hong-Chih A1 Lu, I-Nien A1 Tu, Yu-Fa A1 Chang, Hsi-Ming A1 Tsai, Tsung-Ming A1 Zhang, Sheng-Dong PB Institute of Electrical and Electronics Engineers (IEEE) YR 2020 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 41 IS 1 SP 58 OP 61 LK http://dx.doi.org/https://doi.org/10.1109/led.2019.2952583 DO https://doi.org/10.1109/led.2019.2952583 SF ELIB - SuUB Bremen
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