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Observation of ID-VD Kink in N-Polar GaN MIS-HEMTs at Cryog..:
Bisi, Davide
;
Wienecke, Steven
;
Romanczyk, Brian
...
IEEE Electron Device Letters. 41 (2020) 3 - p. 345-348 , 2020
Link:
https://doi.org/10.1109/led.2020.2968875
RT Journal T1
Observation of ID-VD Kink in N-Polar GaN MIS-HEMTs at Cryogenic Temperatures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2020.2968875&Exemplar=1&LAN=DE A1 Bisi, Davide A1 Wienecke, Steven A1 Romanczyk, Brian A1 Li, Haoran A1 Ahmadi, Elaheh A1 Keller, Stacia A1 Guidry, Matthew A1 De Santi, Carlo A1 Meneghini, Matteo A1 Meneghesso, Gaudenzio A1 Mishra, Umesh K. A1 Zanoni, Enrico PB Institute of Electrical and Electronics Engineers (IEEE) YR 2020 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 41 IS 3 SP 345 OP 348 LK http://dx.doi.org/https://doi.org/10.1109/led.2020.2968875 DO https://doi.org/10.1109/led.2020.2968875 SF ELIB - SuUB Bremen
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