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1 Ergebnisse
1
Improving Drain-Induced Barrier Lowering Effect and Hot Car..:
Hung, Yang-Hao
;
Chang, Ting-Chang
;
Tu, Yu-Fa
...
IEEE Electron Device Letters. 43 (2022) 4 - p. 569-572 , 2022
Link:
https://doi.org/10.1109/led.2022.3149898
RT Journal T1
Improving Drain-Induced Barrier Lowering Effect and Hot Carrier Reliability With Terminal via Structure on Half-Corbino Organic Thin-Film Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2022.3149898&Exemplar=1&LAN=DE A1 Hung, Yang-Hao A1 Chang, Ting-Chang A1 Tu, Yu-Fa A1 Lu, I-Nien A1 Zheng, Yu-Zhe A1 Chiang, Cheng-Ling A1 Chen, Jian-Jie A1 Kuo, Chuan-Wei A1 Sun, Li-Chuan A1 Zhou, Kuan-Ju PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 43 IS 4 SP 569 OP 572 LK http://dx.doi.org/https://doi.org/10.1109/led.2022.3149898 DO https://doi.org/10.1109/led.2022.3149898 SF ELIB - SuUB Bremen
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