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1 Ergebnisse
1
Linking Room- and Low-Temperature Electrical Performance of..:
Kao, K.-H.
;
Godfrin, C.
;
Elsayed, A.
...
IEEE Electron Device Letters. 43 (2022) 5 - p. 674-677 , 2022
Link:
https://doi.org/10.1109/led.2022.3162368
RT Journal T1
Linking Room- and Low-Temperature Electrical Performance of MOS Gate Stacks for Cryogenic Applications
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2022.3162368&Exemplar=1&LAN=DE A1 Kao, K.-H. A1 Godfrin, C. A1 Elsayed, A. A1 Li, R. A1 Simoen, E. A1 Grill, A. A1 Kubicek, S. A1 Radu, I. P. A1 Govoreanu, B. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 43 IS 5 SP 674 OP 677 LK http://dx.doi.org/https://doi.org/10.1109/led.2022.3162368 DO https://doi.org/10.1109/led.2022.3162368 SF ELIB - SuUB Bremen
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