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1 Ergebnisse
1
Impact of Metal Hybridization on Contact Resistance and Lea..:
Su, Sheng-Kai
;
Sanchez-Soares, Alfonso
;
Chen, Edward
...
IEEE Electron Device Letters. 43 (2022) 8 - p. 1367-1370 , 2022
Link:
https://doi.org/10.1109/led.2022.3185991
RT Journal T1
Impact of Metal Hybridization on Contact Resistance and Leakage Current of Carbon Nanotube Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2022.3185991&Exemplar=1&LAN=DE A1 Su, Sheng-Kai A1 Sanchez-Soares, Alfonso A1 Chen, Edward A1 Kelly, Thomas A1 Fagas, Giorgos A1 Greer, James C. A1 Pitner, Gregory A1 Wong, H.-S. Philip A1 Radu, Iuliana P. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 43 IS 8 SP 1367 OP 1370 LK http://dx.doi.org/https://doi.org/10.1109/led.2022.3185991 DO https://doi.org/10.1109/led.2022.3185991 SF ELIB - SuUB Bremen
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