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1 Ergebnisse
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Abnormal Threshold Voltage Degradation Under Semi-On State ..:
Lin, Jia-Hong
;
Ciou, Fong-Min
;
Chang, Ting-Chang
...
IEEE Electron Device Letters. 43 (2022) 9 - p. 1420-1423 , 2022
Link:
https://doi.org/10.1109/led.2022.3190541
RT Journal T1
Abnormal Threshold Voltage Degradation Under Semi-On State Stress in Si3N4/AlGaN/GaN-HEMT
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2022.3190541&Exemplar=1&LAN=DE A1 Lin, Jia-Hong A1 Ciou, Fong-Min A1 Chang, Ting-Chang A1 Lin, Yu-Shan A1 Hsu, Jui-Tse A1 Jin, Fu-Yuan A1 Chang, Kai-Chun A1 Kuo, Ting-Tzu A1 Chen, Kuan-Hsu A1 Hung, Yang-Hao A1 Zheng, Yu-Zhe PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 43 IS 9 SP 1420 OP 1423 LK http://dx.doi.org/https://doi.org/10.1109/led.2022.3190541 DO https://doi.org/10.1109/led.2022.3190541 SF ELIB - SuUB Bremen
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