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1 Ergebnisse
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Analysis of a-InGaZnO TFT Threshold Voltage Instability and..:
Lee, Sangwon
;
Park, Jingyu
;
Yang, Ga Won
...
IEEE Electron Device Letters. 44 (2023) 1 - p. 88-91 , 2023
Link:
https://doi.org/10.1109/led.2022.3221537
RT Journal T1
Analysis of a-InGaZnO TFT Threshold Voltage Instability and Mobility Boosting by Current Stress at a Cryogenic Temperature
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2022.3221537&Exemplar=1&LAN=DE A1 Lee, Sangwon A1 Park, Jingyu A1 Yang, Ga Won A1 Kim, Changwook A1 Choi, Sung-Jin A1 Kim, Dong Myong A1 Bae, Jong-Ho A1 Kim, Dae Hwan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 44 IS 1 SP 88 OP 91 LK http://dx.doi.org/https://doi.org/10.1109/led.2022.3221537 DO https://doi.org/10.1109/led.2022.3221537 SF ELIB - SuUB Bremen
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