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1 Ergebnisse
1
Spatial Degradation Profiling Technique in Self-Aligned Top..:
Park, Jingyu
;
Choi, Sungju
;
Myoung, Seung Joo
...
IEEE Electron Device Letters. 44 (2023) 1 - p. 96-99 , 2023
Link:
https://doi.org/10.1109/led.2022.3225838
RT Journal T1
Spatial Degradation Profiling Technique in Self-Aligned Top-Gate a-InGaZnO TFTs Under Current-Flowing Stress
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2022.3225838&Exemplar=1&LAN=DE A1 Park, Jingyu A1 Choi, Sungju A1 Myoung, Seung Joo A1 Kim, Jae-Young A1 Kim, Changwook A1 Choi, Sung-Jin A1 Kim, Dong Myong A1 Bae, Jong-Ho A1 Kim, Dae Hwan PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 44 IS 1 SP 96 OP 99 LK http://dx.doi.org/https://doi.org/10.1109/led.2022.3225838 DO https://doi.org/10.1109/led.2022.3225838 SF ELIB - SuUB Bremen
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