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1 Ergebnisse
1
Defect Passivation and Reliability Enhancement by Low-Tempe..:
Hung, Wei-Chieh
;
Hung, Wei-Chun
;
Chang, Ting-Chang
...
IEEE Electron Device Letters. 44 (2023) 5 - p. 789-792 , 2023
Link:
https://doi.org/10.1109/led.2023.3260865
RT Journal T1
Defect Passivation and Reliability Enhancement by Low-Temperature-High-Pressure Hydrogenation in LDMOS With 0.13-μm Bipolar-CMOS-DMOS Technology
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2023.3260865&Exemplar=1&LAN=DE A1 Hung, Wei-Chieh A1 Hung, Wei-Chun A1 Chang, Ting-Chang A1 Tu, Yu-Fa A1 Chen, Min-Chen A1 Yeh, Chien-Hung A1 Kuo, Hung-Ming A1 Lee, Ya-Huan A1 Yen, Wei-Ting A1 Liang, Fu-Chen PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 44 IS 5 SP 789 OP 792 LK http://dx.doi.org/https://doi.org/10.1109/led.2023.3260865 DO https://doi.org/10.1109/led.2023.3260865 SF ELIB - SuUB Bremen
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