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1 Ergebnisse
1
Hot Carrier Degradation Accompanied by Recovery in InSnZnO ..:
Zhang, Meng
;
Jiang, Zhendong
;
Deng, Sunbin
...
IEEE Electron Device Letters. 44 (2023) 7 - p. 1124-1127 , 2023
Link:
https://doi.org/10.1109/led.2023.3277823
RT Journal T1
Hot Carrier Degradation Accompanied by Recovery in InSnZnO Thin-Film Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2023.3277823&Exemplar=1&LAN=DE A1 Zhang, Meng A1 Jiang, Zhendong A1 Deng, Sunbin A1 Chen, Zhiying A1 Ma, Xiaotong A1 Tien, Ching-Ho A1 Chen, Lung-Chien A1 Wong, Man A1 Kwok, Hoi-Sing PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 44 IS 7 SP 1124 OP 1127 LK http://dx.doi.org/https://doi.org/10.1109/led.2023.3277823 DO https://doi.org/10.1109/led.2023.3277823 SF ELIB - SuUB Bremen
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