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1 Ergebnisse
1
Development of 400 V-Tolerant Single-Event Effect Hardened ..:
Yuan, Hao
;
Liu, Keyu
;
Liu, Yancong
...
IEEE Electron Device Letters. 44 (2023) 8 - p. 1252-1255 , 2023
Link:
https://doi.org/10.1109/led.2023.3286609
RT Journal T1
Development of 400 V-Tolerant Single-Event Effect Hardened 4H-SiC Schottky Diode With Linear Energy Transfer Upto 83.5 MeV⋅cm2/mg
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2023.3286609&Exemplar=1&LAN=DE A1 Yuan, Hao A1 Liu, Keyu A1 Liu, Yancong A1 Tang, Xiaoyan A1 Zhou, Yu A1 Du, Fengyu A1 Han, Chao A1 Zhang, Yibo A1 Lian, Pengfei A1 Zhang, Yimen A1 Zhang, Yuming A1 Song, Qingwen PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 44 IS 8 SP 1252 OP 1255 LK http://dx.doi.org/https://doi.org/10.1109/led.2023.3286609 DO https://doi.org/10.1109/led.2023.3286609 SF ELIB - SuUB Bremen
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