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1 Ergebnisse
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Contact Length Scaling in Dual-Gate IGZO TFTs:
Wu, Zijing
;
Niu, Jiebin
;
Lu, Congyan
...
IEEE Electron Device Letters. 45 (2024) 3 - p. 408-411 , 2024
Link:
https://doi.org/10.1109/led.2024.3357768
RT Journal T1 <Title>Contact Length Scaling in Dual-Gate IGZO TFTs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2024.3357768&Exemplar=1&LAN=DE A1 Wu, Zijing A1 Niu, Jiebin A1 Lu, Congyan A1 Bai, Ziheng A1 Chen, Kaifei A1 Wu, Zhenhua A1 Lu, Wendong A1 Liu, Menggan A1 Liao, Fuxi A1 Geng, Di A1 Lu, Nianduan A1 Yang, Guanhua A1 Li, Ling PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 45 IS 3 SP 408 OP 411 LK http://dx.doi.org/https://doi.org/10.1109/led.2024.3357768 DO https://doi.org/10.1109/led.2024.3357768 SF ELIB - SuUB Bremen
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