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1 Ergebnisse
1
Hybrid p-GaN/MIS Gate HEMT Suppressing Drain-Induced Dynami..:
Wang, Chen
;
Wang, Jinyan
;
Wang, Xin
...
IEEE Electron Device Letters. 45 (2024) 10 - p. 1732-1735 , 2024
Link:
https://doi.org/10.1109/led.2024.3448362
RT Journal T1
Hybrid p-GaN/MIS Gate HEMT Suppressing Drain-Induced Dynamic Threshold Voltage Instability
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_led.2024.3448362&Exemplar=1&LAN=DE A1 Wang, Chen A1 Wang, Jinyan A1 Wang, Xin A1 Liu, Ziheng A1 He, Jiayin A1 Gao, Ju A1 Ao, Chengkang A1 Wang, Maojun A1 Wei, Jin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 0741-3106 SN 1558-0563 JF IEEE Electron Device Letters VO 45 IS 10 SP 1732 OP 1735 LK http://dx.doi.org/https://doi.org/10.1109/led.2024.3448362 DO https://doi.org/10.1109/led.2024.3448362 SF ELIB - SuUB Bremen
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